microHAL
An abstraction layer for your future F4xx projects
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Unit tests for the ADC driver. More...
Functions | |
struct ADCRegs * | ADC_ (const uint8_t number) |
void | Test_ADCSetPrescaler_EdgeCase_RegisterShouldSetProperly (void) |
void | Test_ADCSetPrescaler_PrescaleIsInvalid_RegisterShouldNotSet (void) |
void | Test_ADCSetResolution_EdgeCase_RegisterShouldSetProperly (void) |
void | Test_ADCSetResolution_ADCIsInvalid_RegisterShouldNotSet (void) |
void | Test_ADCSetResolution_ResolutionIsInvalid_RegisterShouldNotSet (void) |
void | Test_ADCSetSamplerate_EdgeCase_RegisterShouldSetProperly (void) |
void | Test_ADCSetSamplerate_ADCIsInvalid_RegisterShouldNotSet (void) |
void | Test_ADCSetSamplerate_ChannelIsInvalid_RegisterShouldNotSet (void) |
void | Test_ADCSetSamplerate_SamplerateIsInvalid_RegisterShouldNotSet (void) |
void | Test_ADCSetModes_EdgeCase_RegistersShouldSetProperly (void) |
void | Test_ADCSetModes_ADCIsInvalid_RegistersShouldNotSet (void) |
void | Test_ADCSetSeq_EdgeCase_RegistersShouldSetProperly (void) |
void | Test_ADCSetSeq_ADCIsInvalid_RegistersShouldNotSet (void) |
void | Test_ADCSetSeq_SomeSequencesAreInvalid_ShouldClearTheirRegisterBits (void) |
void | Test_ADCSetSeq_CountIsInvalid_ShouldClearItsRegisterBits (void) |
void | Test_ADCOn_EdgeCase_RegisterShouldSetProperly (void) |
void | Test_ADCOn_ADCIsInvalid_RegisterShouldNotSet (void) |
void | Test_ADCOff_EdgeCase_RegisterShouldSetProperly (void) |
void | Test_ADCOff_ADCIsInvalid_RegisterShouldNotSet (void) |
void | Test_ADCRead_EdgeCase_RegisterShouldBeReadProperly (void) |
void | Test_ADCRead_ADCIsInvalid_RegisterShouldNotBeRead (void) |
void | setUp (void) |
void | tearDown (void) |
int | main (void) |
Variables | |
struct ADCRegs | empty_regs = {0} |
struct ADCRegs | test_regs [ADC_PERIPH_LEN+1] |
struct ADCCommonRegs | empty_cregs = {0} |
struct ADCCommonRegs | test_cregs |
struct ADCCommonRegs * | ADC_COMMON = &test_cregs |
Unit tests for the ADC driver.
The unit tests defined in this file handle mostly invalid parameter and edge cases in a stubbed environment. The purpose of these tests is logic checking and does not reflect the actual behaviour of registers in real MCUs.